Hard X-Ray Focal-Plane Compton Spectro-Polarimeter: Detector Development and Sensitivity Evaluation

Abstract

The scientific potential of X-ray polarimetry has long been recognized, yet the challenges of measuring polarization have left it largely unexplored, mainly in the hard X-ray regime. With the advent of hard X-ray focusing optics, sensitive focal-plane Compton polarimeters are now feasible. An early example is CXPOL (Compton X-ray Polarimeter), developed at Physical Research Laboratory (PRL), India, which demonstrated 20 - 80 keV polarimetric capabilities using a plastic scatterer and a CsI(Tl) absorber array. The CXPOL prototype demonstrated polarimetric capabilities in the 20 - 80 keV range, establishing a foundation for further development. Building on this concept, we evaluate a hard X-ray spectro-polarimeter employing a position-sensitive plastic scatterer surrounded by position-sensitive absorber detectors. This geometry enables efficient reconstruction of Compton events and allows combined polarimetric and spectroscopic measurements via interaction positions and deposited energies in the detectors. We evaluate key performance parameters of the revised configuration of the second version of the CXPOL. Using Geant4 simulations, we assess key performance parameters, including modulation factor, polarimetric efficiency, and expected sensitivity with modern hard X-ray optics. We also present the characterization results of first prototype of a 100x20x5 mm3 NaI(Tl) absorber read out on both ends by silicon photomultiplier (SiPM) array operating in coincidence, evaluating energy and position resolution and light-output variation along the detector. The coincidence readout also reduces SiPM background by an order of magnitude. The results demonstrate the strong potential of a position-sensitive Compton- based focal-plane instrument for next-generation hard X-ray spectro-polarimetry.