An Analysis of the Accuracy of the Added Length De-Embedding Methods for Coaxial to Waveguide Adapters in the X-Band
Eric Bauman, James DePoy, Sterling Light, Arya Menon, Marco Iskander
Abstract
This paper assesses the accuracy of the "added length method" (also known as port extension or channel offset) for de-embedding coaxial-to-waveguide transitions in the X-band, comparing it to full waveguide calibration on both Keysight and Rohde & Schwarz VNAs. The study examines the trade-offs between cost and measurement accuracy, highlighting the feasibility of using these mathematical correction techniques in the absence of dedicated waveguide calibration kits or full S-parameter characterizations of the transitions. The analysis concluded that when using coaxial-to-waveguide transitions the added length method produces accurate results for transmission measurements only.
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