Accurate Evaluation of Nanoscale Spatiotemporal Dynamics with Electron Correlation Microscopy

Abstract

Electron correlation microscopy (ECM) can measure materials dynamics with nanoscale spatial resolution from intensity correlation functions. However, adopting X-ray photon correlation spectroscopy (XPCS) normalization frameworks unchanged when calculating intensity correlations can introduce errors. Due to the constrained sampling volumes and larger speckle sizes in nanobeam electron diffraction, XPCS-style time-averaging and scattering-vector averaging introduce systematic artifacts, such as artificial anticorrelations or elevated baselines that lead to systematic errors in structural relaxation times and stretching exponents. This work presents physics-inspired, ECM-specific intensity normalizations over time- and azimuthal-averaged intensities of the first diffraction ring that limit those errors. The framework is validated using molecular dynamics simulations of a CuZr supercooled liquid to benchmark against the self intermediate scattering function, successfully reproducing relaxation times. When applied to experimental time-resolved 4D STEM datasets of a Pt57.5Cu14.7Ni5.3P22.5 nanowire, the method correctly identifies highly stable, unchanging nanoscale crystalline phases that were erroneously misclassified as relaxing domains by previous frameworks. Other previous ECM research is reevaluated in light of these observation. This robust approach establishes an artifact-free pathway for evaluating localized spatiotemporal relaxation behaviors.