Transport-Noise Witnesses of Electronic Multipartite Entanglement
Shuhan Ding, Prakash Sharma, Zecheng Shen, Jiang-Xiazi Lin, Sergei Urazhdin, Yao Wang
Abstract
Entanglement among particles is a defining feature of strongly correlated quantum materials, distinguishing them from conventional metals and semiconductors. The ability to certify intrinsic entanglement among interacting electrons in solid-state materials is important not only for classifying quantum states of matter, but also for developing material-based quantum technologies. Here, we introduce a transport-based protocol for witnessing multipartite entangled electronic states, based on the equilibrium noise spectrum as an experimentally accessible observable. The appropriately integrated, symmetrized, and projected current noise obeys an upper bound that can be derived from microscopic model parameters and is invariant with respect to the choice of electronic basis. We benchmark this framework in several paradigmatic systems, including twisted bilayer graphene, twisted bilayer MoTe2, and Hubbard models, certifying entanglement in the fractional Chern insulating state. The method extends recently developed scattering-based entanglement witnesses to ultralow-temperature materials, where conventional spectroscopic probes are inaccessible but candidate entangled states are expected to arise.
Create a lesson
Related papers
Exact and fast series expansions for quantum models with long-range interactions
Antonia Duft, Patrick Adelhardt, Jan Alexander Koziol et al.
Electronic correlations shape the low-energy optical response of the kagome antiferromagnets Mn3Sn and Mn3Ge
R. Mathew Roy, Bo Tai, Maxim Wenzel et al.
Orbital-Induced Peierls Transitions: How Orbitals Orchestrate Lattice Instability
T. Mizokawa, S. V. Streltsov
Optical investigation of the electronic structure of a ferromagnetic Weyl semimetal CeAlSi
Shin-ichi Kimura, Yue Pan, Hiroshi Watanabe et al.
Assessing the Reliability of Anomalous Hall Conductivity Extraction in GdAlSi
Anil Kumar, Debapratim Pal, Sudhan Koirala et al.
What does "instant thermalization" in large-q SYK models mean?
Alexander Osterkorn, Jan C. Louw