Identification of the length scale parameter of simplified strain gradient elasticity from standard Mode I fracture tests
Yury Solyaev, Kirill Shelkov, Pavel Polyakov
Abstract
Recently, it was shown that additional material constants of strain gradient elasticity (SGE) can be identified for brittle and quasi-brittle materials based on the analysis of experimental data on the crack size effect. In the present paper, we perform precise numerical simulations within SGE and derive regression relations for processing experimental data from standard fracture mechanics tests under pure Mode I loading conditions (CCT, SENT, SENB). We consider the simplified SGE, whose constitutive relations contain a single length scale parameter in addition to the classical elastic constants. We show that, for brittle materials, this parameter can be explicitly identified as ≈ 0.362 (KIc/σult)2. This identification ensures that the fracture loads predicted by classical linear elastic fracture mechanics (LEFM) and by the simplified SGE coincide for relatively long Mode I cracks. However, within the simplified SGE, these fracture loads are evaluated from the nonsingular stress field using the maximum principal stress criterion. For quasi-brittle materials, we derive regression relations that describe the non-classical size effect on strength. This effect is usually treated within nonlinear fracture mechanics but can be naturally captured by SGE. Examples of identification of the length scale parameter based on the established relations and the experimental data for chopped fiber composites and for porous and dense quasi-brittle ceramics are presented.
Create a lesson
Related papers
Divergence between long- and short-wavelength magnon damping in spinel ferrites
Christopher T. Parzyck, Octave Duros, Hari Paudyal et al.
An Atlas and Design Rules for Single- and Dual-Atom Alloys
Fabian Berger, Yicheng Wang, E. Charles H. Sykes et al.
Epitaxial inversion of spontaneous polarization in ε-Ga2O3
Yan Wang, Zhigao Xie, Weihua Tang et al.
Gauge-including neural-network quantum Monte Carlo for molecules in magnetic fields
Chengye Lü, Weizhong Fu, Xin-gao Gong et al.
Photoresponse properties of single-crystalline thick film based on high-entropy topological insulator (Bi3/4Sb1/4)2(Te2/5Se2/5S1/5)3
Alexei Vasilev, Marina Zhezhu, Oleg Ivanov
Adaptive Substrate Support Based on Thin-Film Piezoelectric Actuators
Ertuğ Şimşek, Bas Jansen, Marcelo Ackermann et al.