SMELT: Scaling Laws for Compute-Matched MoE Looped Transformers
Shaowen Wang, Ge Zhang, Kairong Luo, Yuhao Wu, Shaofan Liu, Jiaheng Liu, Wenhao Huang, Shen Yan, Jian Li
Abstract
Looped Transformers increase effective depth by iterating a shared block of layers, but most evaluations compare at fixed model size, conflating architectural advantage with extra FLOPs. We study looping on Mixture-of-Experts Transformers while closely matching per-token FLOPs, total non-embedding parameters, and KV cache. Through a series of ablations, we arrive at a recipe we call SMELT (Sparse MoE Transformer, middle layers Loop Twice), which loops the middle half of layers twice while matching the unlooped Baseline on all three budgets. We scale SMELT across four sizes up to 54B non-embedding parameters and fit a separate Chinchilla-style scaling law for each architecture. SMELT's loss drops faster with compute, saving 6.8--18.0\% of training FLOPs on the compute-optimal frontier. The advantage transfers to downstream benchmarks beyond what validation loss predicts, is largest on Code, and grows with sample length and the number of in-context examples. Mechanistic analysis shows that the second visit reduces the attention sink and redirects mass toward content-relevant tokens, an inductive bias that may underlie the observed performance gains. These results show that looping can improve Transformers even under budget matching, offering a practical recipe that turns depth reuse into measurable gains.
Create a lesson
Related papers
A Common Measure of Communication for Speech Brain-Computer Interfaces
Dulhan Jayalath, Benjamin Ballyk, Oiwi Parker Jones
Graph Machine: Towards Better Pretraining via Edges
Lintai Hou
The Implications of Linguistic Illegibility for LLM Security
James Mickens
Post-Training Language Models for Gold-Medal Performance in Coding Competitions
Aleksander Ficek, Sean Narenthiran, Mehrzad Samadi et al.
UE5M3 FP4 Block Scaling for Stable Language Model Pretraining
Robert Hu, Carlo Luschi, Paul Balanca
Cliff: Learning Process Rewards from the First Mistake
Peixuan Han, Runhui Wang, Ketan Ramaneti et al.