X-ray photoelectron spectroscopy of Ar and Kr clusters formed in He nanodroplets
N. S. Blaj, N. Scheel, R. Rajni, A. Ø. Lægdsmand, J. Sadasivan, S. De, S. R. Krishnan, J. Bozek, A. R. Milosavljević, M. Mudrich
Abstract
We report the first soft x-ray photoelectron spectroscopy (XPS) measurements of Ar and Kr clusters formed inside superfluid helium nanodroplets (HNDs) through consecutive pickup of dopant atoms. Ar and Kr atoms and clusters are selectively inner-shell ionized (Ar 2p, Kr 3d) using monochromatic soft x-ray synchrotron radiation. In the regime of strong doping, the electron spectra exhibit features characteristic of free Ar and Kr atoms as well as their clusters. The Kr cluster spectra agree well with literature data for bare Kr clusters. Backed by detailed simulations of the pickup process, this agreement indicates that the observed spectra originate from nearly bare Ar and Kr clusters, from which most or all He has evaporated in the course of cluster aggregation. These results establish HNDs as a platform for XPS of various types of molecular complexes and nanostructures.
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