Efficiency-Resolved Recovery Dynamics of an Free-Running InGaAs/InP Single Photon Avalanche Detector Operated in Gated Mode
Bruno Santos Souza, Vitor Tavares, Filippo Ghiglieno, Celso Jorge Villas-Boas, Paulo Henrique Dias Ferreira
Abstract
Detection efficiency in gated-mode single-photon avalanche detectors recovers gradually after each gate edge, limiting attainable count rates, yet quantitative recovery models exist only for free-running operation. We extract the gated recovery time constant of a free-running InGaAs/InP detector at 1550 nm by sweeping the gate frequency from 100 kHz to 1 MHz and globally fitting count rates across four dead times, requiring neither a pulsed laser nor a time-to-digital converter. The recovery time decreases linearly with detection efficiency, from 301 to 161 ns between 10 % and 25 %, at 9.3 ns per percentage point. We further resolve a periodic count-rate modulation consistent with bias-dependent capacitive gate feedthrough.
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