Intrinsic Hilbert metrics on cones of equivalent norms
Juan Rafael Acosta-Portilla
Abstract
Let X be a Banach space and let N(X) denote the family of equivalent norms on X. We study Hilbert projective metrics on its projectivization N'(X) induced by ambient cones of nonnegative functions, with particular attention to the intrinsic Hilbert metric induced by the cone N(X)\0\. First, we show that the symmetric logarithmic metric on N'(X) is the Hilbert projective metric induced by the cone of nonnegative real-valued functions, and we characterize the ambient cones that induce the same metric. We then study the intrinsic order on N(X). For this purpose, we introduce the triangular defect Δp(x,y)=p(x)+p(y)-p(x+y) and prove that two norms p,q∈N(X) belong to the same intrinsic part if and only if their triangular defects are uniformly comparable, that is, aΔp≤Δq≤ bΔp for some a,b>0. This yields an explicit formula for the intrinsic Hilbert metric in terms of the pointwise comparison of the norms and of their triangular defects. Finally, the map Φ(p)=(p,Δp) realizes the intrinsic cone order of N(X) inside a canonical product cone of nonnegative functions and preserves the Hilbert metric on each intrinsic part.
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