QUFIG: GNN-Based Prediction of Quantum Fault Injection Vulnerabilities with Gate-Level Precision
Shihan Zhao, Qiying Li, Ben Dong, Qian Wang, Yuntao Liu
Abstract
The growing scale and accessibility of quantum hardware exposed new reliability and security challenges in the quantum computing workflow, such as the run-time fault injection attacks in cloud-based quantum computing platforms. However, existing works fail to identify vulnerabilities with gate-level precision or adapt to run-time environments. In this work, we formulate gate-level fault analysis as a learning-guided prioritization problem under restricted fidelity budgets. The framework uses a circuit-DAG-based GNN backbone to predict the vulnerability score of each gate to each type of injected fault, defined as the impact of the gate-fault pair on circuit fidelity. The gate-fault pairs are then ranked by their vulnerability score. Experiments on QASMbench and HamLib MaxCut show that QUFIG recovers high-impact vulnerable gate-fault pairs with fewer inspections than random and depth-based heuristics. Our results show that QUFIG can reduce the number of gates requiring inspection by 2.9--19.8% while maintaining effective fault identification, allowing quantum circuit designers to identify vulnerabilities and apply targeted defenses more efficiently.
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