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Overlap distributions under the Gibbs measure of a Haar model of |ζ| on and near the critical line

Frédéric Ouimet

math.PRarXiv:2610.14901

Abstract

We study the Gibbs measure of H(h) = Σpj ≤ XUpj/(j pj(σ+ i h)), a random field modeling large values of the log-modulus of the Riemann zeta function on and near the critical line, where the Up are independent and uniformly distributed on the complex unit circle. Writing t = T, the cutoff X and real part σ may vary with T subject to T1/tΦ ≤ X ≤ T1/tϕ and 0 ≤ σ- 1/2 ≤ CσtΦ/ T, for fixed Φ≥ ϕ> 1/2 and Cσ > 0. On Iθ = [ - ( T)θ,( T)θ], define the Gibbs measure Gβ,σ,TH(dh) := eβH(h)dh/∫IθeβH(h')dh'. For every fixed θ> - 1 and inverse temperature β> 0, the limiting joint distributions of correlations (overlaps) among points sampled from this measure are determined after averaging over the Haar phases. At and below βc(θ) = 21 + (θ 0), the limiting two-overlap distribution is concentrated at q0 = |θ 0|. Above this threshold, it assigns masses βc(θ)/β and 1 - βc(θ)/β to q0 and 1, respectively, and the limiting joint overlap distribution is described by a Poisson-Dirichlet process of parameter βc(θ)/β. Approximate Ghirlanda-Guerra identities are shown to hold uniformly for bounded deterministic functions of the sampled positions. This paper is the first in a series devoted to extending these results to |ζ| near the critical line.

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