Simulation of Refraction Through Voxel Volumes
Rainier Mobley, Jean Michel Létang, Max Langer
Abstract
Ray tracing in X-ray science has typically been limited to descriptions where refraction occurs only at interfaces, ignoring the refraction occurring due to the continuous variations in index of refraction in the bulk of a material, as are common in biological samples like bone. We propose a method to simulate X-ray images directly on voxel grids using curved rays. We first validate this method compared to a model with an analytical solution, and then investigate the effects of voxel size, interpolation choice, and illumination to grid alignment on a few simulated test objects. From these investigations, we make several recommendations to guide simulations using these techniques.
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