The XMM-LSS survey: The XMDS/VVDS 4 sigma catalogue
L. Chiappetti, M. Tajer, G. Trinchieri, D. Maccagni, L. Maraschi, L. Paioro, M. Pierre, J. Surdej, O. Garcet, E. Gosset, O. Le Fevre, E. Bertin, H. J. McCracken, Y. Mellier, S. Foucaud, M. Radovich, V. Ripepi, M. Arnaboldi
Abstract
We present a first catalogue of X-ray sources resulting from the central area of the XMM-LSS (Large Scale Structure survey). We describe the reduction procedures and the database tools we developed and used to derive a well defined catalogue of X-ray sources. The present catalogue is limited to a sub-sample of 286 sources detected at 4 sigma in the 1 deg2 area covered by the photometric VVDS (VIRMOS VLT Deep Survey), which allows us to provide optical and radio identifications. We also discuss the X-ray properties of a larger X-ray sample of 536 sources detected at > 4 sigma in the full 3 deg2 area of the XMM Medium Deep Survey (XMDS) independently of the optical identification. We also derive the logN-logS relationship for a sample of more than one thousand sources that we discuss in the context of other surveys at similar fluxes.
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