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Opening a New Window to Fundamental Physics and Astrophysics: X-ray Polarimetry

E. Costa, R. Bellazzini, P. Soffitta, G. di Persio, M. Feroci, E. Morelli, F. Muleri, L. Pacciani, A. Rubini, L. Baldini, F. Bitti, A. Brez, F. Cavalca, L. Latronico, M. M. Massai, N. Omodei, C. Sgro', G. Spandre, G. Matt, G. C. Perola, A. Santangelo, A. Celotti, D. Barret, O. Vilhu, L. Piro, G. Fraser, T. J. -L. Courvoisier, X. Barcons

astro-pharXiv:astro-ph/0603399

Abstract

An extensive theoretical literature predicts that X-ray Polarimetry can directly determine relevant physical and geometrical parameters of astrophysical sources, and discriminate between models further than allowed by spectral and timing data only. X-ray Polarimetry can also provide tests of Fundamental Physics. A high sensitivity polarimeter in the focal plane of a New Generation X-ray telescope could open this new window in the High Energy Sky.

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