Double-Layer Silicon PIN Photodiode X-Ray Detector for a Future X-ray Timing Mission
Hua Feng, Philip Kaaret, Hans Andersson
Abstract
A double-layer silicon detector consisting of two 500micron-thick silicon PIN photodiodes with independent readouts was mounted in a vacuum chamber and tested with X-ray sources. The detector is sensitive from 1-30 keV with an effective area of 6 mm2. The detector performs best at -35 C with an energy resolution of 220 eV (FWHM, full width at half maximum) at 5.9 keV, and is able to operate at room temperature, +25 C, with moderate resolution around 760 eV (FWHM). The response of the top layer sensor is highly uniform across the sensitive area. This large-format silicon detector is appropriate for future X-ray timing missions.
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