Full Frequency Back-Action Spectrum of a Single Electron Transistor during Qubit read-out
Goran Johansson, Andreas Kack, Goran Wendin
Abstract
We calculate the spectral density of voltage fluctuations in a Single Electron Transistor (SET), biased to operate in a transport mode where tunneling events are correlated due to Coulomb interaction. The whole spectrum from low frequency shot noise to quantum noise at frequencies comparable to the SET charging energy (EC/) is considered. We discuss the back-action during read-out of a charge qubit and conclude that single-shot read-out is possible using the Radio-Frequency SET.
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