Crystal Growth of Isotactic Polystyrene in Ultrathin Films : Film Thickness Dependence

Abstract

The film thickness dependence of crystal growth is investigated for isotactic polystyrene (it-PS) in thin films, the thickness of which is from 20nm down to 4nm. The single crystals of it-PS grown at 180 in the ultrathin films show the morphology typical in the diffusion-controlled growth: dense branching morphology (DBM), fractal seeweed (FS). The characteristic length of the morphology, i.e. the width of the branch, increases with decreasing film thickness. The thickness dependence of the growth rate of crystals shows a crossover around the lamellar thickness of the crystal, 8 nm. The thickness dependences of the growth rate and morphology are discussed in terms of the diffusion of chain molecules in thin films.