Electron Correlation Effects in Resonant Inelastic X-ray Scattering of NaV2O5
G. P. Zhang, T. A. Callcott, G. T. Woods, L. Lin, Brian Sales, D. Mandrus, J. He
Abstract
Element- and site-specific resonant inelastic x-ray scattering spectroscopy (RIXS) is employed to investigate electron correlation effects in NaV2O5. In contrast to single photon techniques, RIXS at the vanadium L3 edge is able to probe d-d* transitions between V d-bands. A sharp energy loss feature is observed at -1.56 eV, which is well reproduced by a model calculation including correlation effects. The calculation identifies the loss feature as excitation between the lower and upper Hubbard bands and permits an accurate determination of the Hubbard interaction term U= 3.0 0.2 eV.
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