Dynamic response of the dielectric and electro-optic properties of epitaxial ferroelectric thin films
B. H. Hoerman, B. M. Nichols, B. W. Wessels
Abstract
An analysis of the dynamic dielectric and electro-optic relaxation response of thin film ferroelectrics is presented. The analysis is based upon the relaxation of ferroelectric domains with a continuous distribution of sizes given by percolation theory. The resulting temporal response is described by the expression (t-m) exp(-(t/tau)beta). The analysis was applied to KNbO3 thin films. Measurements of the polarization, birefringence and dielectric transients show qualitative agreement with the model over 11 orders of magnitude in time.
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