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Average and reliability error exponents in low-density parity-check codes

N. S. Skantzos, J. van Mourik, D. Saad, Y. Kabashima

cond-mat.dis-nnarXiv:cond-mat/0304520

Abstract

We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel (BSC) are presented for codes of both finite and infinite connectivity.

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