A Novel Broadband Measurement Method for the Magnetoimpedance of Ribbons and Thin Films
A. Fessant, J. Gieraltowski, C. Tannous, R. Valenzuela
Abstract
A novel broad-band measurement method of the MI in thin films and ribbons is presented. It is based on the automated measurement of the reflection coefficient of a cell loaded with the sample. Illustrative results obtained with a permalloy multilayer thin film are presented and discussed.
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