A Model for Striped Growth
Hai Qian, Gene F. Mazenko
Abstract
We introduce a model for describing the defected growth of striped patterns. This model, while roughly related to the Swift-Hohenberg model, generates a quite different mixture of defects during phase ordering. We find two characteristic lengths in the system: the scaling length L(t), and the average width of the domain walls. The growth law exponent is larger than the value of 1/2 found in typical point defect systems.
Create a lesson
Related papers
Potential energy release rate for solids with bounded domains during evolutions involving changes to boundaries and boundary data
Mrityunjay Kothari, Sayaka Kochiyama, Haneesh Kesari
Arrested phase separation and amorphous patterns in charged binary fluids
Logan H. Grant, Ana Bensabat, Eva Pospivsilova et al.
Shear-driven arrest of dip-coating film entrainment
Theo Witkamp, Stéphane Zaleski, Federico Toschi
How Fluctuations Control Chiral Symmetry Breaking in Reacting Mixtures of Chiral Molecules
Leonardo Silva-Dias, Christoph A. Weber
A new device for live cell imaging of biological samples under in-plane shear
Sidharth Kumar Das, Lyova Mamoyan, Eberhard Bodenschatz et al.
Imbibition dynamics under dissolution-driven fluid thickening
H. W. Almeida, A. F. V. Matias, R. C. V. Coelho et al.