The Hall Effect and ionized impurity scattering in Si(1-x)Gex
P. Kinsler, W. Th. Wenckebach
Abstract
Using Monte Carlo simulations, we demonstrate that including ionized impurity scattering in models of Si(1-x)Gex is vital in order to predict the correct Hall parameters. Our results show good agreement with the experimental data of Joelsson et.al. (JAP, 1997).
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