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The Hall Effect and ionized impurity scattering in Si(1-x)Gex

P. Kinsler, W. Th. Wenckebach

cond-matarXiv:cond-mat/0309082

Abstract

Using Monte Carlo simulations, we demonstrate that including ionized impurity scattering in models of Si(1-x)Gex is vital in order to predict the correct Hall parameters. Our results show good agreement with the experimental data of Joelsson et.al. (JAP, 1997).

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