Ultrafast photoinduced reflectivity transients in (Nd0.5Sr0.5)MnO3
T. Mertelj, D. Mihailovic, Z. Jagličič, A. A. Bosak, O. Yu. Gorbenko, A. R. Kaul
Abstract
The temperature dependence of ultrafast photoinduced reflectivity transients is reported in Nd0.5Sr0.5MnO3 thin film. The photoinduced reflectivity shows a complex response with very different temperature dependences on different timescales. The response on the sub-ps timescale appears to be only weakly sensitive to the 270K-metal-insulator phase transition. Below 160 K the sub-ps response displays a two component behavior indicating inhomogeneity of the film resulting from the substrate induced strain. On the other hand, the slower response on the 10-100 ps timescale is sensitive only to the metal-insulator phase transition and is in agreement with some previously published results. The difference in the temperature dependences of the responses on nanosecond and μs timescales indicates that thermal equilibrium between the different degrees of fredom is established relatively slowly - on a nanosecond timescale.
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