Scaling of the Coercive Field with Thickness in Thin-Film Ferroelectrics
P. Chandra, M. Dawber, P. B. Littlewood, J. F. Scott
Abstract
Motivated by the observed thickness-scaling of the coercive field in ferroelectric films over five decades, we develop a statistical approach towards understanding the conceptual underpinnings of this behavior. Here the scaling exponent is determined by the field-dependence of a known and measured quantity, the nucleation rate per unit area. We end with a discussion of our initial assumptions and point to instances where they could no longer be applicable.
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