Chemically Resolved Electrical Measurements using X-ray Photoelectron Spectroscopy
Hagai Cohen
Abstract
A novel approach is proposed, where energy filtered electrons, carrying both chemical identity and electrical information, serve as fine and flexible electrodes in direct electrical measurements. The method, termed 'chemically resolved electrical measurements' (CREM), is simple and general, demonstrated here with a slightly modified X-ray photoelectron spectrometer. Selected sub-surface regions are electrically analyzed and I-V curves of self-assembled monolayers, free of substrate and top contact contributions, are derived with no need for improved metallic substrates. Unique electrical information is available with this method, further supported by powerful in-situ analytical capabilities and improved top contact performance.
Create a lesson
Related papers
Finite-element reconstruction of molten-zone dynamics and chemical segregation in optical floating-zone grown Ni--Mn--Ga
Denys Musiienko, Taras Kovaliuk, Petr Harcuba et al.
The polar discontinuity picture in nickelate superlattices: comparison of the insulating and metallic phases
Edith Simmen, Jonathan Amara, Philippe Ghosez et al.
Ferroelectric control of magnetic coupling in a Cr dimer adsorbed on α-In2Se3
J. F. Ospina, S. Di Napoli, M. A. Barral
Heat Transport Mechanisms in MOF-5
Zezhu Zeng, Xia Liang, Hengtai Zheng et al.
Zero-Point Renormalization Reshapes the Shift Current: The Role of Electron-Phonon Coupling
Yang Li, Zuzhang Lin, Zhikuan Wang et al.
Half-integer quantum anomalous Hall effect in MnBi2Te4 via non-magnetic extension
Igor P. Rusinov, Tatiana V. Menshchikova, Evgueni V. Chulkov