Logarithmic corrections in the two-dimensional Ising model in a random surface field
M. Pleimling, F. A. Bagamery, L. Turban, F. Igloi
Abstract
In the two-dimensional Ising model weak random surface field is predicted to be a marginally irrelevant perturbation at the critical point. We study this question by extensive Monte Carlo simulations for various strength of disorder. The calculated effective (temperature or size dependent) critical exponents fit with the field-theoretical results and can be interpreted in terms of the predicted logarithmic corrections to the pure system's critical behaviour.
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