Multifractal Measures on Small-World Networks
Kyungsik Kim, K. H. Chang, S. M. Yoon, C. Christopher Lee, J. S. Choi
Abstract
We investigate the multifractals of the normalized first passage time on one-dimensional small-world network with both reflecting and absorbing barriers. The multifractals is estimated from the distribution of the normalized first passage time charactrized by the random walk on the small-world network with three fractions of edges rewired randomly. Particularly, our estimate is the fractal dimension D0 = 0.917, 0.926, 0.930 for lattice points L = 80 and a randomly rewired fraction p = 0.2. The numerical result is found to disappear multifractal properties in the regime p> pc, where pc is the critical rewired fraction.
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