Effect of electron-phonon scattering on shot noise in nanoscale junctions
Yu-Chang Chen, Massimiliano Di Ventra
Abstract
We investigate the effect of electron-phonon inelastic scattering on shot noise in nanoscale junctions in the regime of quasi-ballistic transport. We predict that when the local temperature of the junction is larger than its lowest vibrational mode energy eVc, the inelastic contribution to shot noise (conductance) increases (decreases) with bias as V (V). The corresponding Fano factor thus increases as V. We also show that the inelastic contribution to the Fano factor saturates with increasing thermal current exchanged between the junction and the bulk electrodes to a value which, for V>>Vc, is independent of bias. A measurement of shot noise may thus provide information about the local temperature and heat dissipation in nanoscale conductors.
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