Critical behaviour of thin films with quenched impurities

Abstract

The critical behaviour of thin films containing quenched random impurities and inhomogeneities is investigated by the renormalization-group method. The finite-size crossover in impure films has been considered on the basis of the fundamental relationship between the effective spatial dimensionality and the characteristic lengths of the system. The difference between the critical properties of infinite systems and films is demonstrated and investigated. A new critical exponent, describing the scaling properties of the thickness of films with extended impurities has been deduced and calculated. A special attention is paid to the critical behaviour of real impure films.