Evidence for mass renormalization in LaNiO$"" sub 3: an in situ soft x-ray photoemission study of epitaxial films
K. Horiba, R. Eguchi, M. Taguchi, A. Chainani, A. Kikkawa, Y. Senba, H. Ohashi, S. Shin
Abstract
We investigate the electronic structure of high-quality single-crystal LaNiO3 (LNO) thin films using in situ photoemission spectroscopy (PES). The in situ high-resolution soft x-ray PES measurements on epitaxial thin films reveal the intrinsic electronic structure of LNO. We find a new sharp feature in the PES spectra crossing the Fermi level, which is derived from the correlated Ni 3d eg electrons. This feature shows significant enhancement of spectral weight with decreasing temperature. From a detailed analysis of resistivity data, the enhancement of spectral weight is attributed to increasing electron correlations due to antiferromagnetic fluctuations.
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