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Peak resistance temperature and low temperature resistivity in thin film La1-x Cax Mn O3 mixtures for x <= 1/3

P. R. Broussard

cond-mat.str-elarXiv:cond-mat/0609206

Abstract

The electrical resistivity of La1-xCaxMnO3 thin films grown on (001) NdGaO3 and (100) SrTiO3 substrates by off-axis sputtering has been studied as a function of the Calcium doping level. The samples have very narrow rocking curves and excellent in plane registry with the substrate. A strong correlation between the peak resistance temperature and the polaronic hopping energy is seen which is not simply linear. The low temperature resistivity is seen to be fit better by a model of single magnon scattering, and a near linear correlation between the resistivity due to magnon scattering and static impurities is observed.

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