Millimeter Wave Localization: Slow Light and Enhanced Absorption

Abstract

We exploit millimeter wave technology to measure the reflection and transmission response of random dielectric media. Our samples are easily constructed from random stacks of identical, sub-wavelength quartz and Teflon wafers. The measurement allows us to observe the characteristic transmission resonances associated with localization. We show that these resonances give rise to enhanced attenuation even though the attenuation of homogeneous quartz and Teflon is quite low. We provide experimental evidence of disorder-induced slow light and superluminal group velocities, which, in contrast to photonic crystals, are not associated with any periodicity in the system. Furthermore, we observe localization even though the sample is only about four times the localization length, interpreting our data in terms of an effective cavity model. An algorithm for the retrieval of the internal parameters of random samples (localization length and average absorption rate) from the external measurements of the reflection and transmission coefficients is presented and applied to a particular random sample. The retrieved value of the absorption is in agreement with the directly measured value within the accuracy of the experiment.