On the role of step-flow advection during electromigration-induced step bunching
Matthieu Dufay, Thomas Frisch, Jean-Marc Debierre
Abstract
We propose a one-dimensional model based on the Burton-Cabrera-Frank equations to describe the electromigration-induced step bunching instability on vicinal surfaces. The step drift resulting from atomic evaporation and/or deposition is explicitly included in our model. A linear stability analysis reveals several stability inversions as the evaporation rate varies, while a deposition flux is shown to have a stabilizing effect.
Create a lesson
Related papers
Epitaxial Oxide Thin Films with High Entropy and Anomalous Crystallinity
Joseph Petruska, Christina M. Rost, Jon-Paul Maria et al.
Ionomer-free Iridium Anodes with Low Loading for Zero-gap Electrolyzers via Direct Atomic Layer Deposition
Peter M. Piechulla, Iris Blommestein, Anne van Gerven et al.
Reversible intrinsic-extrinsic crossover of the anomalous Hall effect in PrAlSi via Al/Si ratio tuning
Huiyang Yang, Xiaohua Luo, Hongwei You et al.
Indirect prediction and screening of frustrated magnetic materials using machine learning
Regina Burganova, Irina Piyanzina, Ruslan Akhmerov et al.
Hidden Spin-Valley Hall Effect and Gate-Switchable Electric Hall Effect in 2D Altermagnets
Jiajun Lu, Mu Tian, Chaoxi Cui et al.
Enhancement of local magnetic ordering temperature due to non-magnetic disorder in anti-Heusler alloy Al2MnCu
Soumya Bhowmik, Suvayan Saha, Saikat Debnath et al.