Linear Temperature Variation of the Penetration Depth in YBCO Thin Films

Abstract

We have measured the penetration depth $λ(T)$ on $\rm YBa_{2}Cu_{3}O_{7}$ thin films from transmission at 120, 330 and 510~GHz, between 5 and 50~K. Our data yield simultaneously the absolute value and the temperature dependence of $λ(T)$. In high quality films $λ(T)$ exhibits the same linear temperature dependence as single crystals, showing its intrinsic nature, and $λ(0)=1750\,{\rm Å}$. In a lower quality one, the more usual $T^2$ dependence is found, and $λ(0)=3600\,{\rm Å}$. This suggests that the $T^2$ variation is of extrinsic origin. Our results put the $d$-wave like interpretation in a much better position.