Effect of screening on shot noise in diffusive mesoscopic conductors

Abstract

Shot noise in diffusive mesoscopic conductors, at finite observation frequencies ω (comparable to the reciprocal Thouless time τT-1), is analyzed with an account of screening. At low frequencies, the well-known result SI(ω)=2eI/3 is recovered. This result is valid at arbitrary ω τT for wide conductors longer than the screening length. However, at least for two very different systems, namely, wide and short conductors, and thin conductors over a close ground plane, noise approaches a different fundamental level, SI(ω) = eI, at ω τ T 1.

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