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Finite-Size Effects in Critical Phenomena from Mean Field Approach with ϕ4 Model

C. B. Yang, X. Cai

cond-matarXiv:cond-mat/9701129

Abstract

The finite-size effects in critical phenomena of a thin film system are studied from a mean field (MF) approach with ϕ4 model for second-order phase transition. The influence of boundary condition on the critical properties are emphasized. Scaling functions for relative free-energy and relative specific heat capacity are given.

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