Cluster Monte Carlo: Scaling of Systematic Errors in the 2D Ising Model
Lev N. Shchur, Henk W. J. Blöte
Abstract
We present an extensive analysis of systematic deviations in Wolff cluster simulations of the critical Ising model, using random numbers generated by binary shift registers. We investigate how these deviations depend on the lattice size, the shift-register length, and the number of bits correlated by the production rule. They appear to satisfy scaling relations.
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