Manifestation of quantum chaos on scattering techniques: application to low-energy and photo-electron diffraction intensities
P. L. de Andres, J. A. Vergés
Abstract
Intensities of LEED and PED are analyzed from a statistical point of view. The probability distribution is compared with a Porter-Thomas law, characteristic of a chaotic quantum system. The agreement obtained is understood in terms of analogies between simple models and Berry's conjecture for a typical wavefunction of a chaotic system. The consequences of this behaviour on surface structural analysis are qualitatively discussed by looking at the behaviour of standard correlation factors.
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