A Transport Analysis of the BEEM Spectroscopy of Au/Si Schottky Barriers
U. Hohenester, P. Kocevar, P. L. de Andres, F. Flores
Abstract
A systematic transport study of the ballistic electron emission microscopy (BEEM) of Au/Si(100) and Au/Si(111) Schottky barriers for different thicknesses of the metal layer and different temperatures is presented. It is shown that the existing experimental data are compatible with a recently predicted bandstructure-induced non-forward electron propagation through the Au(111) layer.
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