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Direct determination of the electron-electron mean free path in diffusive mesoscopic samples using shot noise

Y. Naveh

cond-mat.mes-hallarXiv:cond-mat/9806340

Abstract

Using the 'drift-diffusion-Langevin' equation, we have recently shown that finite-frequency shot noise in diffusive mesoscopic conductors is very sensitive to the ratio γ L/ between the sample length L and the electron-electron mean free path . In this work we present numerical calculations of the noise at arbitrary value of γ. If coupled with accurate noise measurements, the results presented here could serve as a new and independent way of determining in a given sample.

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