Quantitative study of laterally inhomogeneous wetting films

Abstract

Based on a microscopic density functional theory we calculate the internal structure of the three-phase contact line between liquid, vapor, and a confining wall as well as the morphology of liquid wetting films on a substrate exhibiting a chemical step. We present a refined numerical analysis of the nonlocal density functional which describes the interface morphologies and the corresponding line tensions. These results are compared with those predicted by a more simple phenomenological interface displacement model. Except for the case that the interface exhibits large curvatures, we find that the interface displacement model provides a quantitatively reliable description of the interfacial structures.