Is the `Finite Bias Anomaly' in planar GaAs-Superconductor junctons caused by point-contact like structures?
S. Chaudhuri, P. F. Bagwell, D. McInturff, J. C. P. Chang, S. Paak, M. R. Melloch, J. M. Woodall, T. M. Pekarek, B. C. Crooker
Abstract
We correlate transmission electron microscope (TEM) pictures of superconducting In contacts to an AlGaAs/GaAs heterojunction with differential conductance spectroscopy performed on the same heterojunction. Metals deposited onto a (100) AlGaAs/GaAs heterostructure do not form planar contacts but, during thermal annealing, grow down into the heterostructure along crystallographic planes in pyramid-like `point contacts'. Random surface nucleation and growth gives rise to a different interface transmission for each superconducting point contact. Samples annealed for different times, and therefore having different contact geometry, show variations in dI/dV characteristic of ballistic transport of Cooper pairs, wave interference between different point emitters, and different types of weak localization corrections to Giaever tunneling. We give a possible mechanism whereby the `finite bias anomaly' of Poirier et al. (Phys. Rev. Lett., 79, 2105 (1997)), also observed in these samples, can arise by adding the conductance of independent superconducting point emitters in parallel.
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