New approach to analysis of negative magnetoresistance. The statistics of the closed paths

Abstract

It is shown that a new kind of information can be extracted from the Fourier transform of negative magnetoresistance (MR) in 2D semiconductor structures. The procedure proposed provides the information on the area distribution function of the closed paths and on the area dependence of the mean length of closed paths $\bar{L} (S)$ . Based on this line of attack the method of analysis of the negative MR is suggested. The method is used for data treatment of negative MR in 2D structures. In previous version (cond-mat/9902038) we suppoused that the difference in area dependence of $\bar{L} (S)$ for structures investigated came from the difference in scattering ansotropy. The more detailed analysis shows that main reason for such difference is different relations between momentum and phase relaxation times.