Single Photon X-Ray Imaging with Si- and CdTe-Sensors
P. Fischer, M. Kouda, S. Krimmel, H. Krueger, M. Lindner, M. Loecker, G. Sato, T. Takahashi, S. Watanabe, N. Wermes
Abstract
Studies of a single photon counting hybrid pixel detector for X-ray imaging applications are presented. A silicon- and a CdTe-sensor were bump bonded onto the MPEC pixel readout chip and could be successfully operated. A new USB based readout system was used for data acquisition. Measurements of the performance on the latest MPEC chip and imaging characterization of the sensors are presented.
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