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A New 76Ge Double Beta Decay Experiment at LNGS

I. Abt, M. Altmann, A. Bakalyarov, I. Barabanov, C. Bauer, E. Bellotti, S. T. Belyaev, L. Bezrukov, V. Brudanin, C. Buettner, V. P. Bolotsky, A. Caldwell, C. Cattadori, H. Clement, A. Di Vacri, J. Eberth, V. Egorov, G. Grigoriev, V. Gurentsov, K. Gusev, W. Hampel, G. Heusser, W. Hofmann, J. Jochum, M. Junker, J. Kiko, I. V. Kirpichnikov, A. Klimenko, K. T. Knoepfle, V. N. Kornoukhov, M. Laubenstein, V. Lebedev, X. Liu, I. Nemchenok, L. Pandola, V. Sandukovsky, S. Schoenert, S. Scholl, B. Schwingenheuer, H. Simgen, A. Smolnikov, A. Tikhomirov, A. A. Vasenko, S. Vasiliev, D. Weisshaar, E. Yanovich, J. Yurkowski, S. Zhukov, G. Zuzel

hep-exarXiv:hep-ex/0404039

Abstract

This Letter of Intent has been submitted to the Scientific Committee of the INFN Laboratori Nazionali del Gran Sasso (LNGS) in March 2004. It describes a novel facility at the LNGS to study the double beta decay of 76Ge using an (optionally active) cryogenic fluid shield. The setup will allow to scrutinize with high significance on a short time scale the current evidence for neutrinoless double beta decay of 76Ge using the existing 76Ge diodes from the previous Heidelberg-Moscow and IGEX experiments. An increase in the lifetime limit can be achieved by adding more enriched detectors, remaining thereby background-free up to a few 100 kg-years of exposure.

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