Sivers effect in Drell Yan at RHIC
J. C. Collins, A. V. Efremov, K. Goeke, M. Grosse Perdekamp, S. Menzel, B. Meredith, A. Metz, P. Schweitzer
Abstract
On the basis of a fit to the Sivers effect in deep-inelastic scattering, we make predictions for single-spin asymmetries in the Drell-Yan process at RHIC.
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