An adaptive significance threshold criterion for massive multiple hypotheses testing
Cheng Cheng
Abstract
This research deals with massive multiple hypothesis testing. First regarding multiple tests as an estimation problem under a proper population model, an error measurement called Erroneous Rejection Ratio (ERR) is introduced and related to the False Discovery Rate (FDR). ERR is an error measurement similar in spirit to FDR, and it greatly simplifies the analytical study of error properties of multiple test procedures. Next an improved estimator of the proportion of true null hypotheses and a data adaptive significance threshold criterion are developed. Some asymptotic error properties of the significant threshold criterion is established in terms of ERR under distributional assumptions widely satisfied in recent applications. A simulation study provides clear evidence that the proposed estimator of the proportion of true null hypotheses outperforms the existing estimators of this important parameter in massive multiple tests. Both analytical and simulation studies indicate that the proposed significance threshold criterion can provide a reasonable balance between the amounts of false positive and false negative errors, thereby complementing and extending the various FDR control procedures. S-plus/R code is available from the author upon request.
Create a lesson
Related papers
Conformal Prediction Through the Lens of Hypothesis Testing: Universality, Impossibility, and Optimality
Ryan J. Tibshirani, Rina Foygel Barber, Aaditya Ramdas
Connecting Riemannian Geometry and Statistical Inference for Correlation Matrices
Argyn Kuketayev
How far can symmetry help? Phase transitions and symmetry selection in sparse functional data analysis
Jocelyn Nembe
Posterior consistency for subdiffusion inverse problems
Haoyu Lu, Shaokang Zu, Junxiong Jia
Dimension comparison for Student's statistic under symmetric unimodality
Jacopo Lenzi
Statistical Properties of Nonparametric MLE under Laplace Noise
Yifei Xiong, Nianqiao Phyllis Ju, Vinayak Rao