XrdML, a new way to store (and exchange) X-ray powder diffraction measurement data
Dr. Thomas Degen
Abstract
Recently PANalytical introduced the XrdML file format as a new data platform for powder diffraction experiments. We will explain why an industrial standard (XML) was chosen and show the XML schema used to precisely describe the instrumental and experimental conditions. This schema is used to validate the contents of the XrdML files. Additionally the integration of the XrdML files with the MS Windows operating system and the MS Windows Explorer will be demonstrated.
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