Bayesian inference of nanoparticle-broadened x-ray line profiles
Abstract
A single and self-contained method for determining the crystallite-size distribution and shape from experimental x-ray line profile data is presented. We have shown that the crystallite-size distribution can be determined without assuming a functional form for the size distribution, determining instead the size distribution with the least assumptions by applying the Bayesian/MaxEnt method. The Bayesian/MaxEnt method is tested using both simulated and experimental CeO2 data. The results demonstrate that the proposed method can determine size distributions, while making the least number of assumptions. The comparison of the Bayesian/MaxEnt results from experimental CeO2 with TEM results is favorable
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